Abstract
Packetized scan testing utilizes a single scan network to efficiently test a large number of ATPG (automatic test-pattern generation) partitions and to enable concurrent testing across multiple partitions. However, concurrent testing can result in high operating current demand and local IR drops. This disclosure describes techniques of efficient ATPG partition grouping based on factors such as scan volume, physical proximity of the partitions, shared power rails, operating current requirements of the core, etc. The resulting groups have an optimal number of cores that avoid operating current overload and IR-drop without substantially impacting test time. A priority index algorithm minimizes power-rail sharing and adjacent co-grouping of cores where possible. A test-time saturation limit is identified beyond which the benefit of grouping cores diminishes, thereby enabling the creation of sub-groups that are maximally time-efficient
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Kumar, Bhavika Ranjeet; Deshpande, Aalhad; Arisetti, Rama Sireesha; Jalasutram, Maheedhar; and Ravipati, Vasubabu, "Optimized Grouping for Packetized ATPG Scan Testing", Technical Disclosure Commons, (July 02, 2025)
https://www.tdcommons.org/dpubs_series/8304