Abstract
System-on-Chip devices often use One-Time-Programmable (OTP) fuses to maintain permanent configuration data, including manufacturing life cycle states and security provisioning. Because programming these physical fuses is an irreversible process, manufacturers frequently delay the testing of end-user features that rely on final fuse states until the concluding stages of manufacturing. Such delayed testing may result in late-stage defect discovery, additional hardware revisions, and longer debugging efforts. The disclosed hardware architecture facilitates the dynamic, non-destructive emulation of configuration fuse states. By employing a multiplexing unit and dedicated control logic, the hardware architecture selectively routes customizable configuration data from a volatile internal memory block into a shadow memory array upon a system reset. This approach enables automated testing systems to validate hardware life cycle states and secure operations without permanently altering the physical configuration of the device.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Sinha, Rohit; Hosseinipour, Afshin; Rupnow, Kyle; Prasad, Janardan; and Thotakura, Rama, "Automated Emulation of Life Cycle States and Configuration Fuses", Technical Disclosure Commons, ()
https://www.tdcommons.org/dpubs_series/10571