Abstract
This publication describes a test point algorithm that uses custom test points to detect faults at a given node in a register-based read-only memory (ROM). Test points to detect faults are inserted at higher combinational depth levels to reduce the overall number of test points used. In some implementations, a combinational depth is calculated, test point nodes are identified, and duplicates are sorted and removed. A flop-based ROM implementation may include address‑decoding logic to obtain specific register content. A flop-based ROM implementation may include an OR tree structure to generate the final ROM output.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Siddhapathak, Krunal and Garg, Ankit, "Novel Test Point Algorithm for Register-Based Read Only Memory", Technical Disclosure Commons, (May 13, 2025)
https://www.tdcommons.org/dpubs_series/8123