Abstract
Field failures of products are frequently modeled using a constant failure rate assumption along with biased device usage times. This methodology provides convenience but may be inaccurate due to the failure rate assumptions and unavailability of precise device usage data. Techniques described herein provide for computing the precise device usage time along with assuming varying failure rates to better estimate field failures.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Chikkam, Ravi Teja; C Pegado, Sean; and Lacy, Colin Joseph, "BAYESIAN METHODOLOGY TO MODEL FIELD FAILURES USING PRECISE OPERATING TIME", Technical Disclosure Commons, (April 24, 2025)
https://www.tdcommons.org/dpubs_series/8034
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