Abstract
Most tests of software for consumer electronic devices involve setup operations prior to actual execution of the test. The setup operations can be time-consuming and are often common across test nodes. This disclosure describes techniques that enable the setup operations to be performed once prior to the start of test execution. The results are shared across multiple test nodes. The techniques thereby reduce test runtimes, and increase the scale and volume of testing.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Sethia, Vishal and Knych, Thomas, "Reducing test runtimes by saving and restoring machine state", Technical Disclosure Commons, (August 14, 2019)
https://www.tdcommons.org/dpubs_series/2404
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