Abstract
This disclosure describes a clocking system configured to dynamically adjust clock frequency in response to localized and global voltage variations across an integrated circuit die. The system employs multiple sensing points distributed across various regions of a semiconductor device to monitor supply voltage levels with low latency. By processing digitized data from these multiple sensors through look-up tables that characterize voltage-to-frequency relationships, the system identifies the most restrictive operating conditions. A centralized clocking element then adapts the output frequency to ensure stable operation even during rapid, high-slew-rate voltage droops. This proactive management allows for higher performance by reducing the need for excessive voltage guardbands.
Keywords: voltage sensor, adaptive clocking, integrated circuit, frequency scaling, look-up table, slew rate, semiconductor die.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
N/A, "Multi-Sense Point Voltage Adaptive Clocking Element", Technical Disclosure Commons, (April 01, 2026)
https://www.tdcommons.org/dpubs_series/9698