Inventor(s)

NAFollow

Abstract

In hyperscale data centers, the sheer volume of installed devices necessitates a substantial daily volume of diagnostic testing. Running all tests can be time-consuming, leading to longer repair times (MTTR) and impacting data center efficiency. This disclosure describes an intelligent test orchestrator (ITO) that leverages machine learning to dynamically sequence tests to rapidly detect failure without executing entire test suites. The ITO dynamically sequences tests based on component lists for each device, diagnostic test coverage information, component failure rates, repair records, test coverage, etc. The described intelligent test orchestrator reduces the time needed to restore repaired devices to the production fleet and improves data center efficiency.

Creative Commons License

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.

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