This disclosure describes techniques for the measurement and testing of silicon backplanes that are utilized in organic light emitting diode (OLED) displays. An interposer silicon (or other interconnect device) is utilized in combination with a reference OLED to test and measure the performance of silicon backplanes. The reference OLED is fabricated onto an interposer silicon and validated optically and/or electrically. Subsequent to the verification of the functionality of the interposer silicon based on the reference OLED, the interposer silicon may be utilized for testing purposes. The interposer silicon comes into contact with the highest metal layers on the silicon backplane under test and routes electrical signals from the silicon backplane to the reference OLED structure and/or to other measurement devices. This enables the properties of the silicon backplane to be measured optically and/or electrically.

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Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.