Abstract
Silicon failures interrupt production flow and the execution of workloads. Silicon failures can substantially reduce productivity, cause material waste, and increase the total cost of operation (TCO) wherever they occur, in particular in data centers that run customer workloads. This disclosure describes techniques to automatically create high coverage, low cost, deterministic, fault-detection silicon circuits to detect and debug silicon failures that occur in data centers while production workloads are executed. The techniques facilitate rapid root cause analysis and resolution.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
n/a, "Automatic Generation of Silicon DFT Checkers Using Formal Assertion and Fault Injection", Technical Disclosure Commons, (June 07, 2023)
https://www.tdcommons.org/dpubs_series/5942