Abstract
A system is proposed herein for converting an unstructured software defect record into a standalone executable detection program that can determine, through read-only operation, whether a live deployment is exposed to the defect. The system performs a staged transformation that derives root-cause and exposure criteria, assesses the availability of required telemetry, enriches missing artifacts from trusted sources, generates detection logic under schema constraints, and validates and repairs the resulting program. A large language model (LLM) assists selected stages, while source grounding, reusable helper routines, multi-stage review, and bounded execution costs produce a reliable operational result. The program can then execute without changing the deployment and provide a per-check result set and an overall exposure verdict.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
Radhakrishnan, Ramesh Babu; Tickoo, Amrit; Tarikere Nagaraj, Praveen Kumar; Pedavala, Mohan Sai Vara Prasad; and Krishnamurthy, Venkat, "MULTI-SOURCE ARTIFACT ENRICHMENT AND VALIDATION FOR AUTOMATED DEFECT-SIGNATURE DETECTION", Technical Disclosure Commons, ()
https://www.tdcommons.org/dpubs_series/11776