This disclosure describes techniques to perform random vibration testing of data center hardware and electronics equipment such as PCBA, machines, switches, and server racks. A shaker table is utilized to simulate multiple test profiles that are defined based on an analysis of a variety of field conditions and measured data from vehicles and handling methods common in the global supply chain. The test setup includes a shaker table, in addition to a vibration data acquisition and analysis system, a high speed power supply and resistance measurement system, and strain data acquisition system using a general purpose data acquisition unit designed for such measurements. A device under test (DUT) is placed on the shaker table and tested under a variety of vibration conditions designed to replicate real world conditions. A synchronized clock is utilized to ensure that all measurements are synchronized across multiple strain gauges, accelerometers, and resistance measurement setups. The resistance measurement setups enable measurement of resistance in real time during testing in order to identify mechanical damage to solder joints and simple electronics components. Rainflow counting based lifetime estimation is performed for the electrical components based on the acceleration, strain, resistance measurements, and measured vibration data in the real world.

Creative Commons License

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.