Techniques are provided herein for using a long-term trend inflection for optics parameters (such as optics error count) to make event predictions. Different methods (e.g., machine learning) may be used to model the inflection. Short-term or instantaneous optics measurements, such as pre-FEC error count, are often a reflection of instantaneous bursts or drifts and are thus not a reliable indicator for pervasive and inherent connection quality issues. A longer term and continuous trend analysis can better predict connection degradation and failure.

Creative Commons License

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.