This disclosure describes a test fixture that enables electrical and/or radio frequency (RF) performance inspection for vertical SMT type pogo pins. The test fixture utilizes pogo pin cradles that enable the characterization of pogo pin performance under SMT mounted conditions without negatively affecting subsequent use in a product. The test fixture includes a set of customized top and bottom test PCBs with designed transmission lines printed on the boards. Vertical distance and angle between the top and bottom PCBs can be adjusted by a control mechanism for easy loading and unloading of the pogo pins under test. A vector network analyzer can be connected to the test fixture to measure the performance of pogo pins being tested. The test fixture enables testing of the pogo pins under SMT mounted conditions and provides accurate characterization of the pogo pins under actual use conditions.

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Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.