Abstract
NAND-flash memories include a matrix of pages. Each column of the matrix is located in one physical semiconductor die. Because errors are correlated such that they occur in groups within a die, error-correcting codes (ECC) are optimally constructed across dies (matrix rows), a principle known as cross-die design. A product ECC is a type of code that encodes rows to one parity and columns to another. Although the row-constituents of product codes are cross-die, the column-constituents are not so. This disclosure describes product ECCs where both constituent codes span semiconductor dies. The described cross-die product codes provide better performance for random errors while maintaining performance comparable to traditional codes for correlated errors, at nearly the same coding overhead. A page in error can be repaired in two unique ways, both of which are cross-die, thereby improving data reliability and speed of repair.
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This work is licensed under a Creative Commons Attribution 4.0 License.
Recommended Citation
N/A, "Product Error-Correcting Codes That Span NAND-Flash Dies", Technical Disclosure Commons, (October 29, 2021)
https://www.tdcommons.org/dpubs_series/4682