It is of interest to know the power consumed when a particular hardware module or software application of a device-under-test (DUT) such as a smartphone is triggered and run.

While the DUT can be controlled externally for timed triggering of modules or applications of interest, such triggering can contaminate power measurement. This disclosure describes techniques to synchronize power measurement with events within a device-under-test. A program within the DUT can temporarily increase or decrease slightly the power consumption of the DUT. A slight increase (decrease) in power consumption is interpreted by the power meter as a one (zero) bit. Prior to an event of interest, the DUT generates a specific bit pattern to herald the start of the event. At the end of the event, the DUT generates another bit pattern. Power consumption attributable to the event is included in the power-consumption waveform between the start and the stop bit-patterns.

Creative Commons License

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.